The family of electron microscopy techniques have become staple methods for imaging nanoscale objects, including nanoparticles, viruses and proteins. The appeal of electron microscopy as a ...
The Helmholtz Center for Materials and Energy in Berlin, Germany (HZB, originally known as Hahn-Meitner Institute, HMI) has developed a novel technique for the cross-sectional sample preparation for ...
This article examines the use of femtosecond (fs) laser ablation for site-specific TEM sample preparation in a FIB-SEM. Various workflows are shown facilitating TEM lamella preparation of regions of ...
JEOL is pleased to announce the introduction of a new CRYO-FIB-SEM, a Focused Ion Beam milling specimen preparation tool specifically designed for creating thin, frozen samples for Cryo-Electron ...
By combining two fundamentally different microscopy techniques, researchers can now measure the optical properties of a ...
In transmission electron microscopy (TEM), where the electron beam passes through the sample to be directly imaged on the detector below, it is often necessary to support the thin samples on a grid.
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